
The FAST tool for synthetic SXR calculations and determination of impurity density and effective charge (Z eff )
Tullio Barbui, Oulfa Chellai, Luis F. Delgado-Aparicio, Alexandre Fil, Beatriz García, Kenneth W Hill, Shinichiro Kojima, Novimir Antoniuk Pablant, Brent C Stratton, D Vezinet, et al.
A new soft x-ray (SXR) synthetic tool has been developed: it is called FAST for FLYCHK-based Atomic physics and SXR Tomography. It is based on FLYCHK SXR emissivity spectra calculated for a variety of elements, from deuterium to tungsten. FAST creates 2D plasma emissivity for arbitrary plasma compositions and plasma profiles. It computes line-integrated SXR profiles based on a specific detector geometry and response. This tool is used to reproduce signals from an absolutely calibrated multi-energy SXR (ME-SXR) camera at WEST. Thanks to its energy-resolved measurement capability, the ME-SXR camera is able to separate spectral regions dominated by impurity line emission from others containing only continuum emission. At WEST, FAST and the ME-SXR camera are employed to determine impurity density profiles for tungsten and nitrogen (used as a proxy for low-Z impurities), as well as the plasma effective charge (Zeff), through SXR measurement reproduction at different energies, from 2 to 14 keV. Tungsten density is determined in two plasma scenarios at WEST: lower hybrid heating in the X-point radiator regime and lower hybrid heating with modulations of ion cyclotron resonance heating. In the first scenario the tungsten profile is found to be moderately peaked in the core with a concentration of 0.8‒1×10-4. This concentration is found to increase up to 1.4×10-4 during ion cyclotron resonance heating. Tungsten peaking factor in steady-state conditions is also retrieved and compared to theoretical predictions. It is found to be slightly lower than the combined neoclassical and turbulent transport prediction.


